Smart and intuitive crack detection
Do you manufacture components that are critical to operation or safety? Then you know that there are a large number of production steps along the value chain of components that put a lot of stress on the materials and sometimes lead to undesirable defects such as hardening cracks, grinding burns or deep-drawing defects. These can not only lead to considerable economic damage in the production line, but can also cause consequential damage to the end user.
With the STATOGRAPH TCL, FOERSTER has developed a cost-effective yet highly efficient inspection system for 100% eddy current crack detection. It can be used both in series production and for manual testing. The various sensors are automatically recognized via a data chip - eliminating the need for lengthy adjustment processes.
Your advantages at a glance
- 100 % control by non-destructive testing: optimally prepared for all testing requirements
- Eddy current crack detection: wide frequency range from 4 Hz to 20 MHz
- State-of-the-art software with intuitive user interface: support functions (wizard) ensure easy operation during parameterization
- Clearance compensation: learning of material-specific distance curves to suppress clearance fluctuations
- Improved test quality: short cable runs between the TCL and the sensor system minimize interference
- Innovative probe recognition: data chip automatically recognizes the probe, directly loading its settings
- Easy automation and line integration via I/O interface
Technical Data
| Dimension and weight: | 176 x 109 x 35 mm; 0,5 kg |
| Power supply: | 24 V, 1250 mA (AC adapter optional) |
| Permissible ambient temperature: | +5°C to +40°C (+41°F to +104°F) |
| Relative humidity: | 8% to 80% |
| IP: | IP40 |
| Frequency range: | 4 Hz to 20 MHz |
| High-/low-pass filter: | 0-50 kHz |
| Evaluation: | Vector (360° threshold), |Y| (phase selective) |
| Sensors: | Differential sensor (with clearance compensation), absolute sensor |
| Signal charts: | Impedance, evaluation signal, y/t diagram, clearance signal (each per revolution or as a time-based scan) |
| Interfaces: | Digital I/O, industrial ethernet, remote |
